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Low temperature homoepitaxy of (010) β-Ga_2O_3 by metalorganic vapor phase epitaxy: Expanding the growth window

机译:由金属机气相外延(010)β-Ga_2O_3的低温同性端:扩张生长窗口

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摘要

In this work, we report on the growth of high-mobility β-Ga_2O_3 homoepitaxial thin films grown at a temperature much lower than the conventional growth temperature window for metalorganic vapor phase epitaxy. Low-temperature β-Ga_2O_3 thin films grown at 600 °C on Fe-doped (010) bulk substrates exhibit remarkable crystalline quality, which is evident from the measured room temperature Hall mobility of 186 cm~2/V s for the unintentionally doped films. N-type doping is achieved by using Si as a dopant, and a controllable doping in the range of 2 × 10~(16)-2 × 10~(19)cm~(-3) is studied. Si incorporation and activation is studied by comparing the silicon concentration from secondary ion mass spectroscopy and the electron concentration from temperature-dependent Hall measurements. The films exhibit high purity (low C and H concentrations) with a very low concentration of compensating acceptors (2 × 10~(15)cm~(-3)) even at this growth temperature. Additionally, an abrupt doping profile with a forward decay of ~ 5nm/dec (10 times improvement compared to what is observed for thin films grown at 810 °C) is demonstrated by growing at a lower temperature.
机译:在这项工作中,我们报告了在低于常规生长温度窗口的温度下生长的高迁移率β-GA_2O_3同性恋薄膜的增长,用于金属有机物气相外延。低温β-GA_2O_3薄膜在Fe掺杂(010)块状基质上产生600℃的薄膜表现出显着的晶体质量,这是从测量的室温霍尔迁移率明显为186cm〜2 / V s的无意掺杂的薄膜。通过使用Si作为掺杂剂实现N型掺杂,并且研究了2×10〜(16)-2×10〜(19)cm〜(-3)的可控掺杂。通过将来自二次离子质谱的硅浓度与温度依赖的霍尔测量的电子浓度进行比较来研究Si掺入和活化。即使在该生长温度下,薄膜也具有非常低的补偿受体(2×10〜(15)cm〜(-3))的浓度高纯度(低C和H浓度)。另外,通过在较低温度下生长来证明,通过在较低温度下生长来证明,通过突然衰减具有前向衰减的速度衰减〜5nm / dec的前进衰减(与在810℃下生长的薄膜相比的10倍改善10倍。

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  • 来源
    《Applied Physics Letters》 |2020年第14期|142102.1-142102.6|共6页
  • 作者单位

    Department of Electrical and Computer Engineering University of Utah Salt Lake City Utah 84112 USA;

    Department of Electrical and Computer Engineering University of Utah Salt Lake City Utah 84112 USA;

    Department of Electrical and Computer Engineering University of Utah Salt Lake City Utah 84112 USA;

    Department of Chemistry University of Utah Salt Lake City Utah 84112 USA;

    Department of Chemistry University of Utah Salt Lake City Utah 84112 USA;

    Department of Electrical and Computer Engineering University of Utah Salt Lake City Utah 84112 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 22:18:03

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