机译:P型金属触点中的屏障高度和费米水平固定
Department of Electrical and Electronic Engineering Bangladesh University of Engineering and Technology Dhaka 1205 Bangladesh;
Microsystems Technology Laboratories Massachusetts Institute of Technology Cambridge Massachusetts 02139 USA;
Department of Electrical and Electronic Engineering Bangladesh University of Engineering and Technology Dhaka 1205 Bangladesh;
Microsystems Technology Laboratories Massachusetts Institute of Technology Cambridge Massachusetts 02139 USA;
机译:通过使用金属/氧化镍/硅触点的费米能级钉扎降低空穴的肖特基势垒高度
机译:通过使用金属/氧化镍/硅触点的费米能级钉扎降低空穴的肖特基势垒高度
机译:准确提取肖特基势垒高度和van der Waals联系人的费米水平脱钉普遍性
机译:Ni-硅化物触点至6H-SIC:接触电阻率和屏障高度在离子植入的n型和屏障高度上对P型癫痫仪
机译:多孔P型硅上所选难熔金属的势垒高度比较
机译:缺陷MoS2 /金属触点中占优势的电荷传输和费米能级固定
机译:二维铁磁体/半导体过渡金属二硫化碳触点:p型肖特基势垒和自旋注入控制