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Singularities and topologically protected states in twisted bilayer graphene

机译:双层石墨烯的奇异性和拓扑保护态

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We have studied the structural and electronic properties of twisted bilayer graphene by scanning tunneling microscopy (STM). For twist angles in the range of about 1 degrees to 4 degrees, the twisted bilayer graphene possesses two Van Hove singularities in the vicinity of the Fermi level. We use the exact location of these Van Hove singularities to determine the twist angle dependent interlayer hopping energy. For a twist angle of 0.6 degrees, we found a hexagonal network of topologically protected one-dimensional channels that run along the boundaries of the AB/BA domains. The electric field in the tunnel junction is responsible for the breaking of the symmetry of the AB and BA domains and the development of the hexagonal network of topologically protected states. The latter shows that the electric field in the tunneling junction can significantly affect the topological nature of two-dimensional materials, and therefore, one should be cautious when interpreting scanning tunneling microscopy and spectroscopy experiments of this class of materials.
机译:我们已经通过扫描隧道显微镜(STM)研究了扭曲的双层石墨烯的结构和电子性能。对于约1度至4度范围内的扭曲角,扭曲的双层石墨烯在费米能级附近具有两个范霍夫奇异性。我们使用这些Van Hove奇点的确切位置来确定依赖于扭曲角度的层间跳跃能量。对于0.6度的扭曲角,我们发现了一个拓扑结构受保护的一维通道的六边形网络,该通道沿着AB / BA域的边界延伸。隧道结中的电场负责破坏AB和BA域的对称性,并发展拓扑保护状态的六边形网络。后者表明隧道结中的电场会显着影响二维材料的拓扑性质,因此,在解释此类材料的扫描隧道显微镜和光谱实验时应谨慎。

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