首页> 外文期刊>Applied Physics Letters >Configurable error correction of code-division multiplexed TES detectors with a cryotron switch
【24h】

Configurable error correction of code-division multiplexed TES detectors with a cryotron switch

机译:带低温开关的码分多路TES检测器的可配置纠错

获取原文
获取原文并翻译 | 示例

摘要

The development of a superconducting analog to the transistor with extremely low power dissipation will accelerate the proliferation of low-temperature circuitry operating in the milliKelvin regime. The thin-film, magnetically actuated cryotron switch is a candidate building block for more complicated and flexible milliKelvin circuitry. We demonstrate its utility for implementing reconfigurable circuitry by integrating a cryotron switch into flux-summed code-division SQUID multiplexed readout for large arrays of transition-edge-sensor (TES) microcalorimeters. Code-division multiplexing eliminates the noise penalty of time-division multiplexing while being drop-in compatible with the latter's control electronics. However, code-division multiplexing is susceptible to single-point failure mechanisms which can result in an unconstrained demodulation matrix and the loss of information from many sensing elements. In the event of a failure, the integrated cryotron switch provides a zero-signal output from a single TES, enabling the demodulation matrix used to compute TES signals from SQUID signals to be constrained and data recovered from the remaining sensors. This demonstration of configurable error correction provides both a real-world application of the cryotron switch and a foundation for more complex circuitry at milliKelvin temperatures.
机译:具有极低功耗的晶体管超导模拟物的发展将加速以毫开尔文(MilliKelvin)体制运行的低温电路的扩散。薄膜磁致动低温冷冻开关是用于更复杂和灵活的毫开尔文电路的候选构件。我们通过将低温开关集成到通量求和的码分SQUID多路读取器中,以用于过渡边缘传感器(TES)微热量计的大型阵列,展示了其用于实现可重构电路的实用程序。码分复用消除了时分复用的噪声损失,同时与时分复用的控制电子设备兼容。然而,码分多路复用容易受到单点故障机制的影响,这可能导致不受约束的解调矩阵以及来自许多传感元件的信息丢失。发生故障时,集成的低温致动器开关可从单个TES提供零信号输出,从而可以约束用于从SQUID信号计算TES信号的解调矩阵,并从其余传感器中恢复数据。可配置纠错的演示既提供了低温电子管开关的实际应用,又为毫开尔文温度下更复杂的电路奠定了基础。

著录项

  • 来源
    《Applied Physics Letters》 |2019年第23期|232602.1-232602.5|共5页
  • 作者单位

    NIST, Boulder, CO 80305 USA|Univ Colorado, Dept Phys, Boulder, CO 80309 USA;

    NIST, Boulder, CO 80305 USA|Univ Colorado, Dept Phys, Boulder, CO 80309 USA;

    NIST, Boulder, CO 80305 USA|Univ Colorado, Dept Phys, Boulder, CO 80309 USA;

    NIST, Boulder, CO 80305 USA|Univ Colorado, Dept Phys, Boulder, CO 80309 USA;

    NIST, Boulder, CO 80305 USA|Univ Colorado, Dept Phys, Boulder, CO 80309 USA;

    NIST, Boulder, CO 80305 USA;

    NIST, Boulder, CO 80305 USA;

    NIST, Boulder, CO 80305 USA;

    NIST, Boulder, CO 80305 USA;

    NIST, Boulder, CO 80305 USA;

    NIST, Boulder, CO 80305 USA|Univ Colorado, Dept Phys, Boulder, CO 80309 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号