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Effects of trifluoromethyl substituents on interfacial and bulk polarization of polystyrene gate dielectrics

机译:三氟甲基取代基对聚苯乙烯栅极电介质界面极化和本体极化的影响

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摘要

The ability to control the bulk and interfacial polarization of dielectric polymers is important to their application in organic electronics. We examine the effect of the trifluoromethyl substituent on poly(3-trifluoromethylstyrene) (P3TFMS) as compared to unsubstituted polystyrene (PS) on the I-V relationships of pentacene-based organic field-effect transistors (OFETs). Single-and double-layered films of these polymers were used, with lower layers crosslinked through vinylbenzocyclobutene comonomers before deposition of upper layers. Control experiments verified that the electronic effect of the crosslinking was negligible. We found that the TFM substituent markedly and independently affected both the initial threshold voltage V-th and the nonvolatile, shifted V-th observed after the application of static gate voltage, depending on its position adjacent or apart from the pentacene. The trifluoromethyl-bearing polymers exhibited significantly lower magnitude initial threshold voltages (V-th,(i) of ca. -17 V for P3TFMS compared to -35V for PS), large threshold voltage shifts after charging by the application of static electric fields (Delta V-th of ca. 32V for P3TFMS and 17 V for PS), and greater stability of the Delta V-th under repeated charge/discharge cycles. These results are consistent with P3TFMS having fewer interfacial trap states butmore stable bulk trap states. The results are applicable to organo-electronic systems such as piezoelectrics for energy harvesting and nonvolatile OFETs such as memory, sensing, and logic elements.
机译:控制介电聚合物的本体和界面极化的能力对于其在有机电子产品中的应用很重要。与未取代的聚苯乙烯(PS)相比,我们研究了并五苯甲基对聚(3-三氟甲基苯乙烯)(P3TFMS)的影响,并五苯基于有机场效应晶体管(OFET)的I-V关系。使用这些聚合物的单层和双层膜,在沉积上层之前,下层通过乙烯基苯并环丁烯共聚单体交联。对照实验证明交联的电子效应可以忽略。我们发现,TFM取代基显着且独立地影响初始阈值电压V-th和施加静态栅极电压后观察到的非易失性位移V-th,这取决于其并五苯的位置。含三氟甲基的聚合物表现出明显较低的初始阈值电压(P3TFMS的V-th,(i)约为PS的-35V,P3TFMS约为-17V),充电后通过施加静电电场有较大的阈值电压漂移( P3TFMS的Delta Vth约为32V,PS的Delta Vth为17V,并且在重复的充电/放电循环下,Delta Vth的稳定性更高。这些结果与P3TFMS具有较少的界面陷阱态但具有更稳定的整体陷阱态相一致。该结果适用于有机电子系统,例如用于能量收集的压电,以及非易失性OFET,例如存储器,感测和逻辑元件。

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  • 来源
    《Applied Physics Letters》 |2019年第2期|023301.1-023301.5|共5页
  • 作者单位

    Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA;

    Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 04:09:29

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