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Ammonium sulfide passivation of Type-II InAs/GaSb superlattice photodiodes

机译:硫化铵钝化II型InAs / GaSb超晶格光电二极管

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We report on the surface passivation of Type-II InAs/GaSb superlattice photodetectors using various ammonium sulfide solutions. Compared to unpassivated detectors, zero-bias resistance of treated 400 μm×400 μm devices with 8 μm cutoff wavelength was improved by over an order of magnitude to ~20 kΩ at 80 K. Reverse-bias dark current density was reduced by approximately two orders of magnitude to less than 10 mA/cm~(2) at -2 V. Dark current modeling, which takes into account trap-assisted tunneling, indicates greater than 70 times reduction in bulk trap density for passivated detectors.
机译:我们报告使用各种硫化铵溶液的II型InAs / GaSb超晶格光电探测器的表面钝化。与未钝化的检测器相比,在80 K时,截止波长为8μm的经过处理的400μm×400μm器件的零偏置电阻提高了一个数量级,达到了约20kΩ。反向偏置暗电流密度降低了大约两个数量级。在-2 V电压下的最大幅度小于10 mA / cm〜(2)。考虑了陷阱辅助隧穿的暗电流模型表明,钝化探测器的体积陷阱密度降低了70倍以上。

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