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Room-temperature epitaxial growth of ferromagnetic Fe_3Si films on Si(111) by facing target direct-current sputtering

机译:通过面对靶直流溅射在Si(111)上室温外延生长铁磁Fe_3Si膜

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摘要

Ferromagnetic Fe_3Si thin films with an extremely smooth surface morphology can be epitaxially grown on Si(111) at room temperature by facing target direct-current sputtering. The epitaxial relationship is Fe_3Si(111)‖Si(111) with Fe_3Si[110]‖Si[110]. By the application of the extinction rule of x-ray diffraction, the generated Fe_3Si was confirmed to possess a B_2 structure and not a DO_3 one. The film showed a saturation magnetization value of 960 emu/cm~3, which was slightly lower than that of bulk DO_3-Fe_3Si. It was observed that the magnetization easy axis was along the [110] direction in the film plane.
机译:通过面对靶直流溅射,可以在室温下在Si(111)上外延生长具有极光滑表面形态的铁磁Fe_3Si薄膜。外延关系为Fe_3Si(111)‖Si(111)与Fe_3Si [110]‖Si[110]。通过应用X射线衍射的消光规则,确认生成的Fe_3Si具有B_2结构而不是DO_3结构。该膜的饱和磁化强度值为960 emu / cm〜3,略低于块状DO_3-Fe_3Si。观察到易磁化轴沿膜平面中的[110]方向。

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