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AlGaAs emitter/GaAs barrier terahertz detector with a 2.3 THz threshold

机译:阈值为2.3 THz的AlGaAs发射器/ GaAs势垒太赫兹检测器

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摘要

A heterojunction interfacial work function internal photoemission (HEIWIP) detector with a threshold frequency (f_0) of 2.3 THz (λ_0=128 μm) is demonstrated. The threshold limit of ~3.3 THz (92 μm) due to the Al fraction being limited to ~0.005, in order to avoid control and transition from alloy to isoelectronic doping behavior, was surpassed using AIGaAs emitters and GaAs barriers. The peak values of responsivity, quantum efficiency, and the specific detectivity at 9.6 THz and 4.8 K for a bias field of 2.0 kV/cm are 7.3 A/W, 29%, 5.3 X 10~(11) Jones, respectively. The background-limited infrared photodetector temperature of 20 K with a 60° field of view was observed for a bias field of 0.15 kV/cm. The f_0 could be further reduced toward ~1 THz regime (~300 μm) by adjusting the Al fraction to offset the effect of residual doping, and/or lowering the residual doping in the barrier, effectively lowering the band bending.
机译:展示了一种异质结界面功函数内部光发射(HEIWIP)检测器,其阈值频率(f_0)为2.3 THz(λ_0= 128μm)。 AlGaAs发射极和GaAs势垒超过了Al含量限制为〜0.005的〜3.3 THz(92μm)的阈值极限,从而避免了从合金到等电子掺杂行为的控制和过渡。对于2.0 kV / cm的偏压场,在9.6 THz和4.8 K时,响应度,量子效率和比检测率的峰值分别为7.3 A / W,29%,5.3 X 10〜(11)Jones。对于0.15 kV / cm的偏压场,观察到背景为60 K的红外光探测器的背景温度为20K。通过调整Al含量以抵消残余掺杂的影响,和/或降低势垒中的残余掺杂,可以有效地减小能带弯曲,从而将f_0进一步降低至〜1 THz范围(约300μm)。

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