Einstein-de Haas effect in a NiFe film deposited on a microcantilever

摘要

A method is presented for determining the magnetomechanical ratio g' in a thin ferromagnetic film deposited on a microcantilever via measurement of the Einstein-de Haas effect. An alternating magnetic field applied in the plane of the cantilever and perpendicular to its length induces bending oscillations of the cantilever that are measured with a fiber optic interferometer. Measurement of g' provides complementary information about the g factor in ferromagnetic films that is not directly available from other characterization techniques. For a 50 nm Ni_(80)Fe_(20) film deposited on a silicon nitride cantilever, g' is measured to be 1.83±0.10.