Atomic force microscopy based, multiphoton, photoelectron emission imaging

摘要

Images of photoelectron emission from metallic surfaces were obtained with a modified atomic force microscope operating in air. Illumination of the samples was achieved in the near field of a metal-coated microcantilever tip, placed in the beam of a femtosecond pulsed laser that is incident at a grazing angle with respect to the sample surface. Photoelectron currents were measured through the tip with a prototype amplifier. The power law dependence of average photocurrent on light intensity is compatible with multiphoton photoelectric effect and the work function of the metal covering a particular area on the two-metal patterned samples used.