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Effect of hydrogen dilution on carrier transport in hydrogenated boron-doped nanocrystalline silicon-silicon carbide alloys

机译:氢稀释对氢化硼掺杂纳米晶硅碳化硅合金中载流子迁移的影响

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摘要

The effect of the hydrogen dilution ratio on characteristics of hydrogenated boron-doped nanocrystalline silicon-silicon carbide alloy (p-nc-Si-SiC:H) films is investigated. Hydrogen coverage near the growing surface causes nanocrystallization by retarding the reactions of the precursors. It was found that p-nc-Si-SiC:H alloys have two different kinds of carrier transport mechanisms: one is the thermally activated hopping conduction between neighboring crystallites near room temperature and the other is the band tail hopping conduction below 150 K. However, the film at the onset of the nanocrystalline growth exhibits a different behavior due to a large band tail disorder.
机译:研究了氢稀释比对氢化硼掺杂纳米晶硅碳化硅合金(p-nc-Si-SiC:H)薄膜性能的影响。生长表面附近的氢覆盖通过延迟前体的反应而导致纳米结晶。已发现,p-nc-Si-SiC:H合金具有两种不同的载流子传输机制:一种是室温附近相邻微晶之间的热激活跳跃传导,另一种是在150 K以下的带尾跳跃传导。 ,由于大的带尾部紊乱,在纳米晶体生长开始时的膜表现出不同的行为。

著录项

  • 来源
    《Applied Physics Letters》 |2006年第10期|p.103120.1-103120.3|共3页
  • 作者单位

    Department of Electrical Engineering and Computer Science, Korea Advanced Institute of Science and Technology, 373-1 Guseong-dong, Yuseong-gu, Daejeon 305-701 Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;计量学;
  • 关键词

  • 入库时间 2022-08-18 03:21:51

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