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Local structure around Mn atoms in cubic (Ga,Mn)N thin films probed by fluorescence extended x-ray absorption fine structure

机译:荧光扩展x射线吸收精细结构探测立方(Ga,Mn)N薄膜中Mn原子周围的局部结构

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摘要

The local structures of Mn atoms incorporated in zinc-blende (Ga,Mn)N thin films have been investigated by fluorescence extended x-ray absorption fine structure analysis (EXAFS). The EXAFS results provide direct evidence for the substitution of the majority of Mn atoms in Ga sites of GaN at 2.5% doping. On the other hand, the simulation result of 10% doped (Ga,Mn)N shows that secondary phases—Mn clusters—are formed. The long-range-order crystal structures of (Ga,Mn)N are also studied by x-ray diffraction. The broadening of rocking curve of 10% doped (Ga,Mn)N is attributed to the existence of mosaic block, which resulted from the earlier mentioned secondary phases. How Mn dopants affect the properties of GaN films is discussed as well.
机译:通过荧光扩展X射线吸收精细结构分析(EXAFS),研究了掺入共混锌(Ga,Mn)N薄膜中的Mn原子的局部结构。 EXAFS结果为掺杂2.5%的GaN的Ga位中的大多数Mn原子提供了直接的证据。另一方面,掺杂10%(Ga,Mn)N的模拟结果表明,形成了第二相Mn团簇。还通过X射线衍射研究了(Ga,Mn)N的长程晶体结构。掺杂10%(Ga,Mn)N的摇摆曲线变宽归因于镶嵌块的存在,这是由前面提到的第二相导致的。还讨论了锰掺杂剂如何影响GaN膜的性能。

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