Polarity-dependent reversible resistance switching in Ge-Sb-Te phase-change thin films

摘要

In this paper, we demonstrate reversible resistance switching in a capacitorlike cell using a Ge-Sb-Te film that does not rely on amorphous-crystalline phase change. The polarity of the applied electric field switches the cell resistance between lower- and higher-resistance states, as was observed in current-voltage characteristics. Moreover, voltage pulses less than 1.25 V showed this switching within time scales of microseconds with more than 40% contrast between the resistance states. The latter are found to be nonvolatile for months. The switching could also be achieved at nanoscales with atomic force microscopy with a better resistance contrast of three orders of magnitude.