机译:通过在生长在半极性(1122)GaN直立衬底上的(Al,In)GaN外延层中的异质界面处的失配位错产生产生部分应变松弛
Department of Materials and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, USA;
Department of Materials and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, USA;
Department of Materials and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, USA;
Department of Materials and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, USA;
Department of Materials and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, USA;
Corning Inc., One Science Center Dr., Corning, New York 14831, USA;
Optoelectronics Laboratory, Mitsubishi Chemical Corporation, 1000 Higashi-Mamiana, Ushiku, Ibaraki 300-1295, Japan;
Department of Materials and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, USA;
Department of Materials and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, USA;
Department of Materials and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, USA;
机译:在半极性自立式GaN衬底上生长的(AI,ln)GaN异质外延层中异质界面处形成失配位错
机译:使用在独立式GaN衬底上生长的外延n-GaN层实现高度稳定且低态密度的Al_2O_3 / GaN界面
机译:通过将Mg离子注入形成在高质量自支撑GaN衬底上的n〜-GaN外延层中形成确定的GaN p-n结
机译:通过在SRTIO3底物上生长的纳米级外延铁电BATIO3薄膜中的错位脱位应变松弛
机译:对常规兼柔性基材生长的外延薄膜放松动力学的观察:界面附近的位错滑动的连续模拟
机译:接近无应变的GaN兼容缓冲层上GaN外延层中的超低穿线位错密度及其在异质外延LED中的应用
机译:使用在独立式GaN衬底上生长的外延n-GaN层实现高稳定性和低态密度Al2O3 / GaN界面
机译:在HpVE生长的模板和自支撑GaN衬底上的N型GaN层的mOCVD生长和蚀刻