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Transplanting assembly of carbon-nanotube-tipped atomic force microscope probes

机译:碳纳米管尖端原子力显微镜探针的移植组件

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摘要

Carbon-nanotube (CNT)-tipped atomic force microscope (AFM) probes were assembled in a deterministic and reproducible manner by transplanting a CNT bearing polymeric carrier to a microelectromechanical systems cantilever. Single-strand CNTs were grown vertically at predefined locations where each CNT was encapsulated into a cylindrical polymer carrier block. Double-layer carners were used for controlling the release of blocks and the exposed length of CNT tips after the assembly. Much reduced complexity in assembly was achieved by transplanting individual CNTs to AFM probes, which could scan nanotrenches and biostructures with little probe artifacts.
机译:通过将载有CNT的聚合物载体移植到微机电系统悬臂中,以确定性和可复制的方式组装了碳纳米管(CNT)尖端原子力显微镜(AFM)探针。在预定义的位置垂直生长单链CNT,在该位置上,每个CNT都封装到圆柱形聚合物载体块中。组装后,使用双层修补剂来控制块的释放和CNT尖端的暴露长度。通过将单个CNT移植到AFM探针中,可以大大降低组装的复杂性,该探针可以扫描纳米沟槽和生物结构,而探针伪影很少。

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  • 来源
    《Applied Physicsletters》 |2009年第19期|151-153|共3页
  • 作者单位

    Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave.,Cambridge, Massachusetts 02139, USA;

    Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave.,Cambridge, Massachusetts 02139, USA;

    Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave.,Cambridge, Massachusetts 02139, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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