PROBE FOR ATOMIC FORCE MICROSCOPE EQUIPPED WITH AN OPTOMECHANICAL RESONATOR, AND ATOMIC FORCE MICROSCOPE COMPRISING SUCH A PROBE

摘要

The invention relates to a probe (100) for an atomic force microscope comprising an optomechanical resonator (102) and a probe tip (103) protruding from the resonator, wherein the resonator is coupled to optical means configured to emit a light beam incident on the resonator and to receive a light beam emerging from the resonator. The optomechanical resonator comprises a body configured to resonate both in a volume mechanical vibration mode and in a volume optical vibration mode, wherein the optical vibration mode is coupled to the mechanical vibration mode such that a mechanical deformation of the resonant body in the mechanical vibration mode induces a change in the light transmission state in the optical vibration mode, which modifies the emerging light beam.