Simultaneous force and current mapping of the Si(111)-(7×7) surface by dynamic force microscopy

摘要

We simultaneously obtain spatial maps of the interaction force and current between conductive tips and the Si(111)-(7×7) surface. The difference in the topographic profiles between atomic force microscopy and scanning tunneling microscopy is clearly visualized. We observe a current drop in the region where the chemical bonding force between the tip and surface atoms becomes significant. The peak values of the conductance above adatom sites are in good agreement with the value previously obtained by the theoretical simulation.