机译:在不同的环境温度下使用掺Ge的SbTe改善相变存储器件的稳定性
Electronic Materials Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-ku,Seoul 136-791, Republic of Korea Department of Material Science and Engineering, Korea Advanced Institute of Science and Technology,335 Gwahangno, Yuseong-gu, Daejeon 305-701, Republic of Korea;
Electronic Materials Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-ku,Seoul 136-791, Republic of Korea;
Electronic Materials Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-ku,Seoul 136-791, Republic of Korea Department of Material Science and Engineering, Seoul National University Gwanak-ro, Gwanak-gu,Seoul 151-742, Republic of Korea;
Electronic Materials Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-ku,Seoul 136-791, Republic of Korea;
Electronic Materials Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-ku,Seoul 136-791, Republic of Korea;
Electronic Materials Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-ku,Seoul 136-791, Republic of Korea;
Department of Material Science and Engineering, Korea Advanced Institute of Science and Technology,335 Gwahangno, Yuseong-gu, Daejeon 305-701, Republic of Korea;
Electronic Materials Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-ku,Seoul 136-791, Republic of Korea;
机译:改进的写入验证方案,用于使用掺Ge的SbTe改善多级单元相变存储器的耐久性
机译:掺Ge SbTe相变材料的快速可扩展存储特性
机译:Ge掺杂SbTe的相变存储器小电流RESET编程特性的受控重结晶
机译:双极性开关操作的相变存储器(PCM)可提高高温可靠性
机译:相变存储器设备中的瞬态相位变化效果
机译:更正:In3SbTe2相变材料中具有替代Bi的晶格畸变
机译:探索IN3SBTE2相变存储器件中的超快阈值切换
机译:相变存储器件用纳米结构电极的热性质