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Room temperature writing of electrically conductive and insulating zones in silicon by nanoindentation

机译:通过纳米压痕在室温下写入硅中的导电和绝缘区域

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摘要

Conventional silicon devices are fabricated in the diamond cubic phase of silicon, so-called Si-I. Other phases of silicon such as Si-Ⅻ and Si-Ⅲ can be formed under pressure applied by nanoindentation and these phases are metastable at room temperature and pressure. We demonstrate in this letter that such phases exhibit different electrical properties to normal (diamond cubic) silicon and exploit this to perform maskless, room temperature, electrical patterning of silicon by writing both conductive and insulating zones directly into silicon substrates by nanoindentation. Such processing opens up a number of potentially new applications without the need for high temperature processing steps.
机译:传统的硅器件是在硅的钻石立方相中制造的,即所谓的Si-I。硅的其他相(例如Si-Ⅻ和Si-Ⅲ)可以在通过纳米压痕施加的压力下形成,并且这些相在室温和压力下是亚稳的。我们在这封信中证明,此类相与普通(菱形)硅具有不同的电特性,并通过纳米压痕将导电区和绝缘区直接写入硅基板,从而利用这种相来执行无掩模,室温下的硅电图案化。这样的处理无需高温处理步骤就开辟了许多潜在的新应用。

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  • 来源
    《Applied Physics Letters》 |2011年第5期|p.052105.1-052105.3|共3页
  • 作者单位

    Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Canberra, ACT 0200, Australia;

    Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Canberra, ACT 0200, Australia;

    Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Canberra, ACT 0200, Australia;

    Department of Electronic Materials Engineering, Research School of Physics and Engineering, Australian National University, Canberra, ACT 0200, Australia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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