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Proposal for all-graphene monolithic logic circuits

机译:全石墨烯单片逻辑电路的提案

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摘要

Since the very inception of integrated circuits, dissimilar materials have been used for fabricating devices and interconnects. Typically, semiconductors are used for devices and metals are used for interconnecting them. This, however, leads to a "contact resistance" between them that degrades device and circuit performance, especially for nanoscale technologies. This letter introduces and explores an "all-graphene" device-interconnect co-design scheme, where a single 2-dimensional sheet of monolayer graphene is proposed to be monolithically patterned to form both active devices (graphene nanoribbon tunnel-field-effect-transistors) as well as interconnects in a seamless manner. Thereby, the use of external contacts is alleviated, resulting in substantial reduction in contact parasitics. Calculations based on tight-binding theory and Non-Equilibrium Green's Function (NEGF) formalism solved self-consistently with the Poisson's equation are used to analyze the intricate properties of the proposed structure. This constitutes the first NEGF simulation based demonstration that devices and interconnects can be built using the "same starting material" - graphene. Moreover, it is also shown that all-graphene circuits can surpass the static performances of the 22 nm complementary metal-oxide-semiconductor devices, including minimum operable supply voltage, static noise margin, and power consumption.
机译:自从集成电路诞生以来,已经使用了不同的材料来制造器件和互连。通常,半导体用于设备,金属用于互连它们。但是,这会导致它们之间的“接触电阻”,从而降低器件和电路性能,特别是对于纳米级技术而言。这封信介绍并探讨了“全石墨烯”器件互连协同设计方案,其中提出了将单层二维石墨烯单层石墨烯进行整体图案化以形成两个有源器件(石墨烯纳米带隧穿场效应晶体管)的方法。 )以及以无缝方式互连。从而,减轻了外部触点的使用,从而大大减少了触点寄生现象。基于紧密约束理论和非平衡格林函数(NEGF)形式主义与泊松方程自洽求解的计算用于分析该结构的复杂特性。这构成了首次基于NEGF模拟的演示,可以使用“相同的起始材料”-石墨烯来构建设备和互连。此外,还表明,全石墨烯电路可以超过22 nm互补金属氧化物半导体器件的静态性能,包括最小的可操作电源电压,静态噪声容限和功耗。

著录项

  • 来源
    《Applied Physics Letters》 |2013年第8期|083113.1-083113.5|共5页
  • 作者单位

    Department of Electrical and Computer Engineering, University of California, Santa Barbara, California 93106, USA;

    Department of Electrical and Computer Engineering, University of California, Santa Barbara, California 93106, USA;

    Department of Electrical and Computer Engineering, University of California, Santa Barbara, California 93106, USA;

    Department of Electrical and Computer Engineering, University of California, Santa Barbara, California 93106, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 03:16:37

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