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Linear temperature behavior of thermopower and strong electron-electron scattering in thick F-doped SnO_2 films

机译:掺F的厚SnO_2薄膜中热电的线性温度行为和强电子电子散射

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摘要

Both the semi-classical and quantum transport properties of F-doped SnO_2 thick films (~1 μm) were investigated experimentally. We found that the resistivity caused by the thermal phonons obeys Bloch-Grueneisen law from ~90 to 300 K, while only the diffusive thermopower, which varies linearly with temperature from 300 down to 10 K, can be observed. The phonon-drag thermopower is completely suppressed due to the long electron-phonon relaxation time in the compound. These observations, together with the fact that the carrier concentration has negligible temperature dependence, indicate that the conduction electrons in F-doped SnO_2 films possess free-electron-like characteristics. At low temperatures, the electron-electron scattering dominates over the electron-phonon scattering and governs the inelastic scattering process. The theoretical predications of scattering rates of large- and small-energy-transfer electron-electron scattering processes, which are negligibly weak in three-dimensional disordered conventional conductors, are quantitatively tested in this lower carrier concentration and free-electron-like highly degenerate semiconductor.
机译:实验研究了掺F的SnO_2厚膜(〜1μm)的半经典和量子输运性质。我们发现,由热声子引起的电阻率在约90至300 K时服从Bloch-Grueneisen定律,而仅观察到随温度从300到10 K线性变化的扩散热能。由于化合物中较长的电子-声子弛豫时间,因此完全抑制了声子拖曳热功率。这些观察结果以及载流子浓度具有可忽略的温度依赖性这一事实表明,掺F的SnO_2薄膜中的导电电子具有类似自由电子的特性。在低温下,电子-电子散射在电子-声子散射中占主导地位,并控制非弹性散射过程。在较低的载流子浓度和类似自由电子的高度退化的半导体中,定量测试了大能量和小能量转移电子-电子散射过程的散射率的理论预测,这些散射率在三维无序常规导体中微不足道。 。

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  • 来源
    《Applied Physics Letters》 |2014年第4期|042110.1-042110.5|共5页
  • 作者

    Wen-Jing Lang; Zhi-Qing Li;

  • 作者单位

    Tianjin Key Laboratory of Low Dimensional Materials Physics and Preparing Technology,Department of Physics, Tianjin University, Tianjin 300072, China;

    Tianjin Key Laboratory of Low Dimensional Materials Physics and Preparing Technology,Department of Physics, Tianjin University, Tianjin 300072, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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