首页> 外文期刊>Thin Solid Films >F-doped SnO_2 thin films grown on flexible substrates at low temperatures by pulsed laser deposition
【24h】

F-doped SnO_2 thin films grown on flexible substrates at low temperatures by pulsed laser deposition

机译:通过脉冲激光沉积在低温下在柔性基板上生长的F掺杂SnO_2薄膜

获取原文
获取原文并翻译 | 示例
           

摘要

Fluorine-doped tin oxide (SnO_2:F) films were deposited on polyethersulfone plastic substrates by pulsed laser deposition. The electrical and optical properties of the SnO_2:F films were investigated as a function of deposition conditions such as substrate température and oxygen partial pressure during deposition. High quality SnO_2:F films were achieved under an optimum oxygen pressure range (7.4-8 Pa) at relatively low growth temperatures (25-150 ℃). As-deposited films exhibited low electrical resistivities of 1-7 mil-cm, high optical transmittance of 80-90% in the visible range, and optical band-gap energies of 3.87-3.96 eV. Atomic force microscopy measurements revealed a reduced root mean square surface roughness of the SnO_2:F films compared to that of the bare substrates indicating planarization of the underlying substrate.
机译:通过脉冲激光沉积将氟掺杂的氧化锡(SnO_2:F)薄膜沉积在聚醚砜塑料基板上。研究了SnO_2:F薄膜的电学和光学性质与沉积条件的关系,例如沉积过程中的衬底温度和氧分压。在较低的生长温度(25-150℃)下,在最佳氧气压力范围(7.4-8 Pa)下获得了高质量的SnO_2:F薄膜。所沉积的薄膜在可见光范围内显示出1-7 mil-cm的低电阻率,80-90%的高光学透射率以及3.87-3.96 eV的带隙能。原子力显微镜测量显示,与裸露的基材相比,SnO_2:F膜的均方根粗糙度降低,表明下层基材已平坦化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号