首页> 外文期刊>Applied Physics Letters >Reduction in the concentration of cation vacancies by proper Si-doping in the well layers of high AlN mole fraction Al_xGa_(1-x)N multiple quantum wells grown by metalorganic vapor phase epitaxy
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Reduction in the concentration of cation vacancies by proper Si-doping in the well layers of high AlN mole fraction Al_xGa_(1-x)N multiple quantum wells grown by metalorganic vapor phase epitaxy

机译:通过金属有机气相外延生长的高AlN摩尔分数Al_xGa_(1-x)N多量子阱的阱层中的适当Si掺杂来减少阳离子空位浓度

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摘要

Appropriate-amount Si-doping in the well layers significantly improved the luminescence efficiency of Al_(0.68)Ga_(0.32)N/Al_(0.77)Ga_(0.23)N multiple quantum wells. To understand the mechanisms, spatio-time-resolved cathodoluminescence measurements and self-consistent Schrodinger-Poisson calculations were carried out. The increase in the luminescence lifetime at room temperature, which reflects the decrease in the concentration of nonradiative recombination centers (NRCs), was correlated with increased terrace width of Si-doped wells. The results suggest the importance of H_3SiNH_2 doping-reactant formation that gives rise to enhanced decomposition of NH_3 and provides wetting conditions by surface Si-N bonds, which reduce the total energy and concentration of NRCs composed of cation vacancies.
机译:阱层中适当数量的Si掺杂显着提高了Al_(0.68)Ga_(0.32)N / Al_(0.77)Ga_(0.23)N多量子阱的发光效率。为了理解机理,进行了时空分辨阴极发光测量和自洽的薛定inger-泊松计算。室温下发光寿命的增加反映了非辐射复合中心(NRCs)浓度的降低,这与掺Si阱的平台宽度增加有关。结果表明,H_3SiNH_2掺杂反应物形成的重要性可以增强NH_3的分解,并通过表面Si-N键提供润湿条件,从而降低总能量和阳离子空位构成的NRC的浓度。

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  • 来源
    《Applied Physics Letters》 |2015年第12期|121602.1-121602.5|共5页
  • 作者单位

    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba, Sendai 980-8577, Japan;

    Graduate School of Regional Innovation Studies, Mie University, Tsu 514-8507, Japan;

    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba, Sendai 980-8577, Japan;

    Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba, Sendai 980-8577, Japan;

    Department of Electrical and Electronic Engineering, Mie University, Tsu 514-8507, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:15:19

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