机译:具有相关表面粗糙度的纳米线中声子传输的普遍特征
Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA;
Department of Electrical and Computer Engineering, University of Massachusetts Amherst, Amherst, Massachusetts 01003, USA;
Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA,Intel Corporation, Hillsboro, Oregon, USA;
Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA;
Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA;
机译:纳米线中声子传输的普遍性受表面粗糙度支配
机译:表面粗糙度主导的纳米线中的声子传输普遍性
机译:抑制纳米线中的声子传输:声子-表面-粗糙度相互作用的简单模型
机译:表面粗糙度和声子散射对极窄的InAs-Si纳米线TFET的影响
机译:具有锯齿形表面粗糙度的纳米压缩物和纳米线的热输运理论研究
机译:纳米线长度和表面粗糙度对无Nafion垂直排列的Pt纳米线阵列电极的电化学传感器性能的影响
机译:纳米线中声子传输的通用特征 表面粗糙度
机译:通过核/壳纳米线管理声子传输。