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Low driving voltage band-filling-based Ⅲ-Ⅴ-on-silicon electroabsorption modulator

机译:基于低驱动电压带填充的Ⅲ-Ⅴ-硅上电吸收调制器

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摘要

In this paper, a method for realizing a low driving voltage electroabsorption modulator based on the band-filling effect is demonstrated. The InP-based electroabsorption modulator is integrated using divinylsiloxane-bis-benzocyclobutene adhesive bonding on a silicon-on-insulator waveguide platform. When the electroabsorption modulator is forward biased, the band-filling effect occurs, which leads to a blue shift of the exciton absorption spectrum, while the absorption strength stays almost constant. In static operation, an extinction ratio of more than 20 dB with 100mV bias variation is obtained in an 80 μm long device. In dynamic operation, 1.25 Gbps modulation with a 6.3 dB extinction ratio is obtained using only a 50 mV peak-to-peak driving voltage. The band-filling effect provides a method for realizing ultra-low-driving-voltage electroabsorption modulators.
机译:本文介绍了一种基于带填充效应的低驱动电压电吸收调制器的实现方法。基于InP的电吸收调制器是通过在绝缘体上硅波导平台上使用二乙烯基硅氧烷-双-苯并环丁烯粘合剂粘合来集成的。当电吸收调制器被正向偏置时,会发生能带填充效应,这会导致激子吸收光谱发生蓝移,而吸收强度几乎保持恒定。在静态操作中,在80μm长的器件中,具有100mV偏置变化的消光比超过20 dB。在动态操作中,仅使用50 mV峰峰值驱动电压即可获得具有6.3 dB消光比的1.25 Gbps调制。带填充效应提供了一种用于实现超低驱动电压电吸收调制器的方法。

著录项

  • 来源
    《Applied Physics Letters》 |2016年第14期|141104.1-141104.5|共5页
  • 作者单位

    Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China,Photonics Research Group, Department of Information Technology, Ghent University-IMEC, Ghent B-9000, Belgium;

    Photonics Research Group, Department of Information Technology, Ghent University-IMEC, Ghent B-9000, Belgium,State Key Laboratory of Modern Optical Instrumentation, Centre for Integrated Optoelectronics, Department of Optical Engineering, Zhejiang University, Hangzhou 310027, China;

    Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China;

    Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China;

    Photonics Research Group, Department of Information Technology, Ghent University-IMEC, Ghent B-9000, Belgium;

    Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China,Photonics Research Group, Department of Information Technology, Ghent University-IMEC, Ghent B-9000, Belgium;

    Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China;

    ZJU-SCNU Joint Research Center of Photonics, Centre for Optical and Electromagnetic Research, South China Academy of Advanced Optoelectronics, Science Building No. 5, South China Normal University, Higher-Education Mega-Center, Guangzhou 510006, China;

    State Key Laboratory of Modern Optical Instrumentation, Centre for Integrated Optoelectronics, Department of Optical Engineering, Zhejiang University, Hangzhou 310027, China;

    Photonics Research Group, Department of Information Technology, Ghent University-IMEC, Ghent B-9000, Belgium;

    Photonics Research Group, Department of Information Technology, Ghent University-IMEC, Ghent B-9000, Belgium;

    ZJU-SCNU Joint Research Center of Photonics, Centre for Optical and Electromagnetic Research, South China Academy of Advanced Optoelectronics, Science Building No. 5, South China Normal University, Higher-Education Mega-Center, Guangzhou 510006, China;

    Centre for Optical and Electromagnetic Research, State Key Laboratory for Modern Optical Instrumentation, Zhejiang University, Hangzhou 310058, China,ZJU-SCNU Joint Research Center of Photonics, Centre for Optical and Electromagnetic Research, South China Academy of Advanced Optoelectronics, Science Building No. 5, South China Normal University, Higher-Education Mega-Center, Guangzhou 510006, China;

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  • 正文语种 eng
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  • 入库时间 2022-08-18 03:14:37

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