Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation

摘要

We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the gradient of electrostatic force rather than electrostatic force. It features a simple implementation and faster scanning as it requires no low frequency modulation. We show that applying a coherent ac voltage with two times the cantilever oscillation frequency induces the dissipation signal proportional to the electrostatic force gradient which depends on the effective dc bias voltage including the contact potential difference. We demonstrate the KPFM images of a MoS_2 flake taken with the present method are in quantitative agreement with those taken with the frequency modulated Kelvin probe force microscopy technique.