Heterodyne technique in photoinduced force microscopy with photothermal effect

摘要

The heterodyne technique is used to detect short-range forces. Using the heterodyne technique, we demonstrate photoinduced force microscopy (PiFM) imaging and z-spectroscopy without the artifact of photothermal vibration. The rejection ratio was at least 99.975% under a high-scattering condition. In addition, the heterodyne technique employs the optimal amplitude at the first resonance frequency of the cantilever to detect the photoinduced force sensitively. According to our calculation, the optimal ratio of the amplitude to the distance between the dipole of the tip and that of the sample is 0.4448. The heterodyne technique can be employed to perform PiFM without the artifact by using the optimal amplitude.