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首页> 外文期刊>Applied Physics Letters >Multiferroic heterostructures of Fe_3O_4/PMN-PT prepared by atomic layer deposition for enhanced interfacial magnetoelectric couplings
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Multiferroic heterostructures of Fe_3O_4/PMN-PT prepared by atomic layer deposition for enhanced interfacial magnetoelectric couplings

机译:通过原子层沉积制备的Fe_3O_4 / PMN-PT的多铁异质结构,用于增强界面磁电耦合

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摘要

In this work, multiferroic heterostructures have been prepared by in situ growing oxide magnetic films on ferroelectric single crystal substrates using atomic layer deposition (ALD). Strong interfacial mechanical coupling between the magnetic and ferroelectric phases has been created, arising from the formation of chemical bonds at the interface due to the nature of layer-by-layer self-limiting growth mechanism of the ALD technique. An enhanced magnetoelectric (ME) coupling has been achieved, which allows an electric field to robustly switch magnetic anisotropy up to 780 Oe. In addition, electrical impulse non-volatile tuning of magnetism has also been realized through partially coupled ferroelectric/ferroelastic domain switching. The ALD growth of magnetic oxide films onto ferroelectric substrates provides an effective platform for the preparation of multiferroic heterostructures at low temperatures with an improved ME coupling, demonstrating a great potential for applications in 3D spintronics, microelectronics and data storages.
机译:在这项工作中,已经通过使用原子层沉积(ALD)在铁电单晶衬底上原位生长氧化物磁性膜来制备多铁异质结构。由于ALD技术的逐层自限生长机制的性质,在界面上形成了化学键,从而在磁相和铁电相之间建立了牢固的界面机械耦合。已经实现了增强的磁电(ME)耦合,它允许电场将磁各向异性牢固地切换到780 Oe。此外,还通过部分耦合的铁电/铁弹性域切换实现了电脉冲的非易失性磁调谐。磁性氧化物膜在铁电衬底上的ALD生长为低温下多铁异质结构的制备提供了有效的平台,并具有改进的ME耦合,显示了在3D自旋电子学,微电子学和数据存储中的巨大潜力。

著录项

  • 来源
    《Applied Physics Letters》 |2017年第8期|082902.1-082902.5|共5页
  • 作者单位

    Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China;

    Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China,Collaborative Innovation Center of High-End Manufacturing Equipment, Xi'an Jiaotong University, Xi'an 710049, China;

    Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China;

    Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China;

    Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China;

    Collaborative Innovation Center of High-End Manufacturing Equipment, Xi'an Jiaotong University, Xi'an 710049, China,State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China;

    Collaborative Innovation Center of High-End Manufacturing Equipment, Xi'an Jiaotong University, Xi'an 710049, China,State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China;

    Collaborative Innovation Center of High-End Manufacturing Equipment, Xi'an Jiaotong University, Xi'an 710049, China,State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China;

    Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China,Collaborative Innovation Center of High-End Manufacturing Equipment, Xi'an Jiaotong University, Xi'an 710049, China;

    Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, China,Collaborative Innovation Center of High-End Manufacturing Equipment, Xi'an Jiaotong University, Xi'an 710049, China,Department of Chemistry and 4D LABS, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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