机译:SrTiO_3-La_(0.7)Sr-(0.3)MnO_3多层膜的非光谱组成测量
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA;
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA;
Faculty of Science and Technology, University of Twente, Carre 3239, 7500 AE Enschede, The Netherlands;
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA;
机译:局部厚度和组成测量通过像素化检测器获得的二进制非晶体材料的扫描会聚光束电子衍射
机译:La_(0.14)Pr_(0.56)Sr_(0.3)MnO_3 / SrTiO_3和La_(0.7)Ca_(0.3)MnO_3 / Gd_(0.7)Ca_(0.3)MnO_3多层中的非铁磁绝缘界面区域
机译:在La_(0.7)Ca_(0.3)MnO_3 / Gd_(0.7)Ca_(0.3)MnO_3多层结构中观察到大的低场磁阻
机译:LA_(0.7)CA_(0.3)MNO_3外延薄膜的扫描隧穿显微镜和电位研究
机译:使用X射线衍射和会聚光束电子衍射测量应变硅的晶格应变和弛豫效应
机译:使用三束布拉格表面衍射的Si0.7Ge0.3 / Si界面应变的深度分布
机译:SrTiO3-La0.7Sr0.3MnO3多层膜的非光谱组成测量