Application of spherical near-field measurements to microwave holographic diagnosis of antennas

摘要

Microwave diagnosis of antennas is considered as a viable tool for the determination of reflector surface distortions and location of defective radiating elements of array antennas. A hybrid technique based on the combination of the spherical near-field measurements and holographic metrology reconstruction is presented. The measured spherical near-field data are first used to construct the far-field amplitude and phase patterns of the antenna on specified regularized u-v coordinates. These data are then utilized in the surface profile reconstruction of the holographic technique using a fast-Fourier-transform (FFT)/iterative approach. Results of an experiment using a 156-cm reflector antenna measured at 11.3 GHz are presented for both the original antenna and the antenna with four attached bumps. Several contour and gray-scaled plots are presented for the reconstructed surface profiles of the measured antennas. The recovery effectiveness of the attached bumps has been demonstrated. The hybrid procedure presented is used to assess the achieved accuracy of the holographic reconstruction technique because of its ability to determine very accurate far-field amplitude and phase data from the spherical near-field measurements.