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Photon-Assisted Oxygen Diffusion and Oxygen-Related Traps in Organic Semiconductors

机译:有机半导体中的光子辅助氧扩散和与氧有关的陷阱

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Organic molecular crystals represent an excellent platform for fundamental studies of optoelectronic properties of organic semiconductors. Rubrene, in particular, has attracted significant attention due to a very low density of charge traps, record-high charge carrier mobility, and a very large micrometer-scale exciton diffusion length. In this study, using rubrene as a model compound questions related to the interaction of crystalline organic semiconductors with oxygen are addressed. Although the chemistry of photo-oxidation of rubrene in solution and gas phases is understood based on self-sensitized photo-oxidation (see for example, Ref.), the mechanism of oxygen incorporation and its effect on the photophysical properties of crystalline rubrene still remain controversial. Mitrofanov et al. identified an oxygen-related in-gap band in photo-oxidized rubrene by means of a two-photon photoluminescence excitation spectroscopy and showed that oxygen is concentrated near the surface of the crystals. Krellner et al. revealed that an oxygen-related impurity forms an acceptor-like in-gap state in rubrene with an energy ≈0.28 eV above the highest occupied molecular orbital (HOMO). X. Song et al.
机译:有机分子晶体为基础研究有机半导体的光电特性提供了一个极好的平台。特别是由于电荷陷阱的密度非常低,电荷载流子迁移率达到创纪录的高度以及微米级激子扩散长度非常大,因此引起了人们的极大关注。在这项研究中,使用红荧烯作为模型,研究了与晶体有机半导体与氧相互作用有关的复合问题。尽管基于自敏化光氧化可以理解溶液和气相中红荧烯的光氧化化学性质(例如,参见参考文献),但氧结合的机理及其对结晶红荧烯的光物理性质的影响仍然存在有争议的。 Mitrofanov等。通过双光子光致发光激发光谱法确定了光氧化红荧烯中与氧有关的能带,并显示氧集中在晶体表面附近。 Krellner等。揭示了与氧有关的杂质在红荧烯中形成受体样的带隙态,其能量比最高占据分子轨道(HOMO)高约0.28 eV。 X.Song等。

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  • 来源
    《Advanced Materials》 |2011年第8期|p.981-985|共5页
  • 作者单位

    Physics Department, Rutgers UniversityPiscataway, NJ 08854, USA,Department of Chemistry Rutgers University Piscataway, N) 08854, USA;

    Department of Chemistry Rutgers University Piscataway, N) 08854, USA;

    Department of Chemistry Rutgers University Piscataway, N) 08854, USA ,Institute for Advanced Materials and Devices for Nanotechnology Rutgers University Piscataway, NJ 08854, USA;

    Institute for Advanced Materials and Devices for Nanotechnology Rutgers University Piscataway, NJ 08854, USA;

    Physics Department, Rutgers UniversityPiscataway, NJ 08854, USA,Institute for Advanced Materials and Devices for Nanotechnology Rutgers University Piscataway, NJ 08854, USA;

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