Controlled Ablation of Langmuir-Blodgett Films Made by Scanning Force Microscopy

摘要

In this paper we present results concerning the development of a lithographic technique suitable for application to Langmuir-Blodgett films. Controlled ablations of well-defined portions of the film have been made by using a scanning force microscope (SFM). We report the values of the microscope operational parameters that have allowed us either to perform non-destructive imaging or to obtain reproducible ablations of controlled depth. In particular, our analysis has pointed out the importance of the scanning speed in giving rise to such surface modifications.