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Approximate Storage in Solid-State Memories

机译:固态存储器中的近似存储

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Memories today expose an all-or-nothing correctness model that incurs significant costs in performance, energy, area, and design complexity. But not all applications need high-precision storage for all of their data structures all of the time. This article proposes mechanisms that enable applications to store data approximately and shows that doing so can improve the performance, lifetime, or density of solid-state memories. We propose two mechanisms. The first allows errors in multilevel cells by reducing the number of programming pulses used to write them. The second mechanism mitigates wear-out failures and extends memory endurance by mapping approximate data onto blocks that have exhausted their hardware error correction resources. Simulations show that reduced-precision writes in multilevel phase-change memory cells can be 1.7× faster on average and using failed blocks can improve array lifetime by 23% on average with quality loss under 10%.
机译:今天的内存揭示了一种全有或全无的正确性模型,该模型会在性能,能耗,面积和设计复杂性方面招致重大成本。但是,并非所有应用程序始终都需要为其所有数据结构提供高精度存储。本文提出了使应用程序能够大致存储数据的机制,并表明这样做可以提高固态存储器的性能,寿命或密度。我们提出两种机制。第一种通过减少用于写入多级单元的编程脉冲的数量来允许多级单元中的错误。第二种机制通过将近似数据映射到已用尽其硬件纠错资源的块上,从而减轻了磨损故障并扩展了内存耐用性。仿真表明,在多级相变存储单元中降低精度的写入平均速度可以快1.7倍,并且使用故障块可以将阵列寿命平均提高23%,而质量损失低于10%。

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