Observations of specimen morphology effects on near-zone-axis convergent-beam electron diffraction patterns

摘要

Symmetries in the intensity distributions of convergent-beam electron diffraction (CBED) patterns are governed not only by the atomic structure of the unit cell but by the morphology of the diffracting specimen as a whole. A simple interpretation based on structural tilt projections and the multislice scattering theory may prove useful in extracting morphological information embedded in the presence or absence of CBED pattern symmetries for a wide range of applications, from 4D scanning transmission electron microscopy to bonding electron density studies in nano-structured materials.