Evaluation of a neural network‐based photon beam profile deconvolution method

摘要

The authors have previously shown the feasibility of using an artificial neural network (ANN) to eliminate the volume average effect (VAE) of scanning ionization chambers (ICs). The purpose of this work was to evaluate the method when applied to beams of different energies (6 and 10 MV) and modalities [flattened (FF) vs unflattened (FFF)], measured with ICs of various sizes.