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Real-Time Stripe Width Computation Using Back Propagation Neural Network for Adaptive Control of Line Structured Light Sensors

机译:基于反向传播神经网络的条纹宽度实时计算用于线结构光传感器的自适应控制

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摘要

A line structured light sensor (LSLS) is generally constituted of a laser line projector and a camera. With the advantages of simple construction, non-contact, and high measuring speed, it is of great perspective in 3D measurement. For traditional LSLSs, the camera exposure time is usually fixed while the surface properties can be varied for different measurement tasks. This would lead to under/over exposure of the stripe images or even failure of the measurement. To avoid these undesired situations, an adaptive control method was proposed to modulate the average stripe width (ASW) within a favorite range. The ASW is first computed based on the back propagation neural network (BPNN), which can reach a high accuracy result and reduce the runtime dramatically. Then, the approximate linear relationship between the ASW and the exposure time was demonstrated via a series of experiments. Thus, a linear iteration procedure was proposed to compute the optimal camera exposure time. When the optimized exposure time is real-time adjusted, stripe images with the favorite ASW can be obtained during the whole scanning process. The smoothness of the stripe center lines and the surface integrity can be improved. A small proportion of the invalid stripe images further proves the effectiveness of the control method.
机译:线结构光传感器(LSLS)通常由激光线投影仪和照相机构成。具有结构简单,无接触,测量速度快的优点,在3D测量中具有广阔的前景。对于传统的LSLS,相机的曝光时间通常是固定的,而表面属性可以针对不同的测量任务而变化。这会导致条纹图像曝光不足/过度曝光,甚至导致测量失败。为了避免这些不希望的情况,提出了一种自适应控制方法来在期望范围内调制平均条纹宽度(ASW)。首先基于反向传播神经网络(BPNN)计算ASW,该ASW可以达到高精度结果并大大减少了运行时间。然后,通过一系列实验证明了ASW和曝光时间之间的近似线性关系。因此,提出了线性迭代程序来计算最佳相机曝光时间。实时调整最佳曝光时间后,可以在整个扫描过程中获得带有喜欢的ASW的条纹图像。条纹中心线的平滑度和表面完整性可以得到改善。一小部分无效条纹图像进一步证明了该控制方法的有效性。

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