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Incorporation of Linear Spacer Molecules in Vapor Deposited Silicone Polymer Thin Films

机译:线性间隔分子在气相沉积有机硅聚合物薄膜中的结合

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摘要

Poly (trivinyl-trimethyl-cyclotrisiloxane) or polyV3D3 is a promising insulating thin film known for its potential application in neural probe fabrication. However, its time-consuming synthesis rate renders it impractical for manufacturing standards. Previously, the growth mechanism of polyV3D3 was shown to be affected by significant steric barriers. This article describes the synthesis of a copolymer of polyV3D3 via initiated chemical vapor deposition (iCVD) using V3D3 as the monomer, hexavinyl disiloxane (HVDS) as a spacer, and tert-butyl peroxide (TBP) as the initiator to obtain nearly a 4-fold increase in deposition rate. The film formation kinetics is limited by the adsorption of the reactive species on the surface of the substrate with an activation energy of −41.5 kJ/mol with respect to substrate temperature. The films deposited are insoluble in polar and non polar solvents due to their extremely crosslinked structure. They have excellent adhesion to silicon substrates and their adhesion properties are retained after soaking in a variety of solvents. Spectroscopic evidence shows that the films do not vary in structure after boiling in DI water for 1 hour, illustrating hydrolytic stability. PolyV3D3-HVDS has a bulk resistivity of 5.6 (±1) × 1014 Ω-cm, which is comparable to that of parylene-C; the insulating thin film currently used in neuroprosthetic devices.
机译:聚(三乙烯基-三甲基-环三硅氧烷)或聚V3D3是一种有前途的绝缘薄膜,以其在神经探针制造中的潜在应用而闻名。然而,其费时的合成速率使其不适用于制造标准。以前,polyV3D3的生长机制已显示受明显的空间屏障影响。本文介绍了使用V3D3作为单体,六乙烯基二硅氧烷(HVDS)作为间隔基,叔丁基过氧化物(TBP)作为引发剂,通过引发化学气相沉积(iCVD)合成聚V3D3的共聚物,从而获得近4倍增加沉积速率。成膜动力学受到反应性物质在基板表面上的吸附的限制,其相对于基板温度的活化能为-41.5 kJ / mol。沉积的薄膜由于具有极强的交联结构,因此不溶于极性和非极性溶剂。它们对硅基材具有出色的附着力,在各种溶剂中浸泡后仍可保持其附着力。光谱证据表明,在去离子水中煮沸1小时后,膜的结构没有变化,说明了水解稳定性。 PolyV3D3-HVDS的体电阻率为5.6(±1)×10 14 Ω-cm,与聚对二甲苯-C相当。当前用于神经修复设备的绝缘薄膜。

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