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High-Density Mapping of an Adult-Plant Stripe Rust Resistance Gene YrBai in Wheat Landrace Baidatou Using the Whole Genome DArTseq and SNP Analysis

机译:利用全基因组DArTseq和SNP分析高分子量定位小麦长白品种大成抗条纹锈病基因YrBai

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摘要

Stripe rust, caused by the biotrophic fungus Puccinia striiformis f. sp. tritici (Pst), is one of the most widespread and destructive wheat diseases worldwide. Growing resistant cultivars is an effective approach for controlling this disease. However, because host resistance genes were easily overcome by new virulent Pst races, there is a continuous demand for identifying new effective wheat stripe rust resistance genes and develop closely linked markers for marker-assisted selection (MAS). Baidatou, an old Chinese wheat landrace, has been grown for several decades in Longnan region, Gansu Province, where stripe rust epidemics are frequent and severe. In our previous study, a single dominant gene YrBai in Baidatou was identified to control the adult-plant resistance (APR) to Chinese prevalent Pst race CYR33. And the gene was located on wheat chromosome 6DS by four polymorphic simple sequence repeat (SSR) and two sequence-related amplified polymorphism (SRAP) markers, with the genetic distances of two closely linked markers 3.6 and 5.4 cM, respectively. To further confirm the APR gene in Baidatou and construct the high-density map for the resistance gene, adult plants of F1, F2, F3, and F5:6 populations derived from the cross Mingxian169/Baidatou and two parents were inoculated with CYR33 at Yangling field, Shaanxi Province during 2014–2015, 2015–2016, and 2016–2017 crop seasons, respectively. The field evaluation results indicated that a single dominant gene confers the APR to Pst race CYR33 in Baidatou. 92 F3 lines and parents were sequenced using DArTseq technology based on wheat GBS1.0 platform, and 31 genetic maps consisted of 2,131 polymorphic SilicoDArT and 952 SNP markers spanning 4,293.94 cM were constructed. Using polymorphic SilicoDArT, SNP markers and infection types (ITs) data of F3 lines, the gene YrBai was further located in 0.8 cM region on wheat chromosome 6D. These closely linked markers developed in this study should be useful for MAS for Baidatou in crop improvement and map-based clone this gene.
机译:条纹锈菌,是由生物营养真菌Puccinia striiformis f引起的。 sp。 Tritici(Pst)是世界上最广泛和最具破坏力的小麦疾病之一。生长抗药性品种是控制这种疾病的有效方法。但是,由于寄主抗性基因很容易被新的强力Pst种族克服,因此不断需要鉴定新的有效小麦条锈病抗性基因并开发紧密相连的标记物以进行标记辅助选择(MAS)。百大头是中国古老的小麦地方品种,在甘肃省Long南地区已经生长了几十年,那里的条纹锈病很普遍而且很严重。在我们之前的研究中,确定了百达头的单个显性基因YrBai可控制成年植物对中国流行的Pst种族CYR33的抗性。该基因通过四个多态性简单重复序列(SSR)和两个序列相关的扩增多态性(SRAP)标记位于小麦6DS染色体上,两个紧密连锁的标记的遗传距离分别为3.6和5.4 cM。为了进一步确定白大头的APR基因并构建抗病基因的高密度图谱,在杨凌对来自明县169 /白大头杂交的F1,F2,F3和F5:6种群的成年植物和两个亲本接种了CYR33。陕西省2014-2015年,2015-2016年和2016-2017年作物季节。田间评估结果表明,单个显性基因将APR赋予白大头的Pst族CYR33。利用基于小麦GBS1.0平台的DArTseq技术对92条F3品系和亲本进行了测序,构建了由2,131个多态性SilicoDArT和952个SNP标记组成的31个遗传图谱,涵盖了4,293.94 cM。利用多态性SilicoDArT,SNP标记和F3品系的感染类型(ITs)数据,YrBai基因进一步位于小麦6D染色体上的0.8 cM区域。在这项研究中开发的这些紧密联系的标志物应该对MAS的Baidatou作物改良和基于图的克隆该基因有用。

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