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High Sensitivity Detection of CdSe/ZnS Quantum Dot-Labeled DNA Based on N-type Porous Silicon Microcavities

机译:基于N型多孔硅微腔的CdSe / ZnS量子点标记DNA高灵敏度检测

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摘要

N-type macroporous silicon microcavity structures were prepared using electrochemical etching in an HF solution in the absence of light and oxidants. The CdSe/ZnS water-soluble quantum dot-labeled DNA target molecules were detected by monitoring the microcavity reflectance spectrum, which was characterized by the reflectance spectrum defect state position shift resulting from changes to the structures’ refractive index. Quantum dots with a high refractive index and DNA coupling can improve the detection sensitivity by amplifying the optical response signals of the target DNA. The experimental results show that DNA combined with a quantum dot can improve the sensitivity of DNA detection by more than five times.
机译:在不存在光和氧化剂的情况下,在HF溶液中使用电化学蚀刻来制备N型大孔硅微腔结构。通过监测微腔反射光谱来检测CdSe / ZnS水溶性量子点标记的DNA目标分子,其特征在于反射光谱的缺陷状态因结构折射率的变化而发生位置偏移。具有高折射率和DNA耦合的量子点可以通过放大目标DNA的光响应信号来提高检测灵敏度。实验结果表明,结合量子点的DNA可以将DNA检测的灵敏度提高五倍以上。

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