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Comparative study of initial stages of copper immersion deposition on bulk and porous silicon

机译:块状和多孔硅上铜浸入沉积初始阶段的比较研究

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摘要

Initial stages of Cu immersion deposition in the presence of hydrofluoric acid on bulk and porous silicon were studied. Cu was found to deposit both on bulk and porous silicon as a layer of nanoparticles which grew according to the Volmer-Weber mechanism. It was revealed that at the initial stages of immersion deposition, Cu nanoparticles consisted of crystals with a maximum size of 10 nm and inherited the orientation of the original silicon substrate. Deposited Cu nanoparticles were found to be partially oxidized to Cu2O while CuO was not detected for all samples. In contrast to porous silicon, the crystal orientation of the original silicon substrate significantly affected the sizes, density, and oxidation level of Cu nanoparticles deposited on bulk silicon.
机译:研究了在氢氟酸存在下在块状硅和多孔硅上进行铜浸渍沉积的初始阶段。发现铜既沉积在块状硅上,又沉积在多孔硅上,作为根据Volmer-Weber机理生长的纳米颗粒层。结果表明,在浸渍沉积的初始阶段,Cu纳米颗粒由最大尺寸为10 nm的晶体组成,并继承了原始硅衬底的取向。发现沉积的Cu纳米颗粒被部分氧化为Cu2O,而并非所有样品都检测到CuO。与多孔硅相反,原始硅衬底的晶体取向显着影响沉积在块状硅上的Cu纳米颗粒的尺寸,密度和氧化水平。

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