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Effects of Defects on the Mechanical Properties of Kinked Silicon Nanowires

机译:缺陷对弯折的硅纳米线力学性能的影响

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摘要

Kinked silicon nanowires (KSiNWs) have many special properties that make them attractive for a number of applications. The mechanical properties of KSiNWs play important roles in the performance of sensors. In this work, the effects of defects on the mechanical properties of KSiNWs are studied using molecular dynamics simulations and indirectly validated by experiments. It is found that kinks are weak points in the nanowire (NW) because of inharmonious deformation, resulting in a smaller elastic modulus than that of straight NWs. In addition, surface defects have more significant effects on the mechanical properties of KSiNWs than internal defects. The effects of the width or the diameter of the defects are larger than those of the length of the defects. Overall, the elastic modulus of KSiNWs is not sensitive to defects; therefore, KSiNWs have a great potential as strain or stress sensors in special applications.Electronic supplementary materialThe online version of this article (doi:10.1186/s11671-017-1970-7) contains supplementary material, which is available to authorized users.
机译:弯折的硅纳米线(KSiNW)具有许多特殊的特性,使其在许多应用中具有吸引力。 KSiNW的机械性能在传感器的性能中起着重要作用。在这项工作中,使用分子动力学模拟研究了缺陷对KSiNWs力学性能的影响,并通过实验间接验证了这一点。结果发现,由于不和谐的变形,扭结是纳米线(NW)的弱点,从而导致弹性模量小于直的NW的弹性模量。此外,表面缺陷比内部缺陷对KSiNW的机械性能影响更大。缺陷的宽度或直径的影响大于缺陷的长度的影响。总体而言,KSiNWs的弹性模量对缺陷不敏感。电子补充材料本文的在线版本(doi:10.1186 / s11671-017-1970-7)包含补充材料,授权用户可以使用。

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