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Low-Cost Flexible ZnO Microwires Array Ultraviolet Photodetector Embedded in PAVL Substrate

机译:嵌入PAVL基板的低成本柔性ZnO微线阵列紫外光电探测器

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摘要

With the advent of wearable device technology, fabrication of inorganic semiconductor devices on flexible organic substrates is of great interest. In this paper, a fascinating method and a low-cost flexible substrate material polyvinyl alcohol (PVAL) have been utilized to embed ZnO microwire (MW) array to produce ultraviolet (UV) photodetector (PD) with decent photoresponsivity. The flexible PVAL substrate is relatively cheap and has better bendability as compared to polyethylene terephthalate (PET) and other traditional flexible substrate materials, which makes it unique in comparison to traditional devices. The device shows a current photoresponsivity of 29.6 A/W in the UV spectral range (350 to 380 nm) and maintains an excellent detection performance with even a bending angle of 180°. In dark, a low current of 1.4 μA at 5 V bias and response time of 4.27 ms was observed. In addition to the excellent device performance at wide bending angles, the fabricated device also performs well with the bending radii close to 0. Therefore, ZnO MW array PD has a great potential for the real-time monitoring of harmful UV exposure to warn the users for the appropriate arrangement avoidance.
机译:随着可穿戴设备技术的出现,在柔性有机基板上制造无机半导体器件引起了人们的极大兴趣。在本文中,一种引人入胜的方法和低成本的柔性基板材料聚乙烯醇(PVAL)被嵌入到ZnO微线(MW)阵列中,以产生具有良好光响应性的紫外(UV)光电探测器(PD)。与聚对苯二甲酸乙二酯(PET)和其他传统的柔性基板材料相比,柔性的PVAL基板相对便宜并且具有更好的可弯曲性,这使其在传统设备中独树一帜。该设备在UV光谱范围(350至380nm)中显示出29.6 A / W的电流光响应率,即使弯曲角度为180°,也能保持出色的检测性能。在黑暗中,在5V偏压下的低电流为1.4μA,响应时间为4.27ms。除了在宽弯曲角度下具有出色的器件性能外,所制造的器件在弯曲半径接近0时也表现良好。因此,ZnO MW阵列PD在实时监测有害紫外线暴露方面具有巨大潜力,可以警告用户为了避免适当的安排。

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