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Fully transparent flexible tin-doped zinc oxide thin film transistors fabricated on plastic substrate

机译:在塑料基板上制造的全透明柔性掺锡氧化锌薄膜晶体管

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摘要

In this work, we have successfully fabricated bottom gate fully transparent tin-doped zinc oxide thin film transistors (TZO TFTs) fabricated on flexible plastic substrate at low temperature by RF magnetron sputtering. The effect of O2/Ar gas flow ratio during channel deposition on the electrical properties of TZO TFTs was investigated, and we found that the O2/Ar gas flow ratio have a great influence on the electrical properties. TZO TFTs on flexible substrate has very nice electrical characteristics with a low off-state current (Ioff) of 3 pA, a high on/off current ratio of 2 × 107, a high saturation mobility (μsat) of 66.7 cm2/V•s, a steep subthreshold slope (SS) of 333 mV/decade and a threshold voltage (Vth) of 1.2 V. Root-Mean-Square (RMS) roughness of TZO thin film is about 0.52 nm. The transmittance of TZO thin film is about 98%. These results highlight that the excellent device performance can be realized in TZO film and TZO TFT can be a promising candidate for flexible displays.
机译:在这项工作中,我们已经成功地通过射频磁控溅射在低温下在柔性塑料基板上制造了底栅全透明掺锡氧化锌薄膜晶体管(TZO TFT)。研究了沟道沉积过程中O2 / Ar气体流量比对TZO TFTs电学性能的影响,发现O2 / Ar气体流量比对电学性能有很大影响。柔性基板上的TZO TFT具有非常好的电特性,其关态电流(Ioff)为3 pA,开/关电流比为2×10 7 ,饱和迁移率(μsat)高)为66.7 cm 2 / V•s,陡峭的亚阈值斜率(SS)为333 mV /十倍,阈值电压(Vth)为1.2V。均方根(RMS)粗糙度为TZO薄膜约为0.52 nm。 TZO薄膜的透射率约为98%。这些结果表明,可以在TZO膜中实现出色的器件性能,而TZO TFT可以成为柔性显示器的有希望的候选者。

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