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Synthesis Giant Dielectric and Pyroelectric Response of 001-Oriented Pr3+ Doped Pb(Mg1/3Nb2/3)O3-PbTiO3 Ferroelectric Nano-Films Grown on Si Substrates

机译:硅衬底上生长的001取向的Pr3 +掺杂的Pb(Mg1 / 3Nb2 / 3)O3-PbTiO3铁电纳米膜的合成巨电介质和热电响应

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摘要

The [001]-oriented Pr3+ doped Pb(Mg1/3Nb2/3)O3-0.30PbTiO3 (Pr-PMN-PT) thin films with a composition near the morphotropic phase boundary (MPB) were synthesized by a sol–gel method. The crystal structure was characterized using X-ray diffraction. It was found that a single perovskite phase was achieved in Pr-PMN-PT thin films annealed at 650 °C for 3 min. The dielectric constant (εr) value was 2400 in 2.5% Pr-PMN-PT thin films at room temperature, 110% higher than that of pure PMN-PT samples. Through 2.5% Pr3+ doping, remanent polarization (Pr) and coercive field (Ec) values increased from 11.5 μC/cm2 and 35 kV/cm to 17.3 μC/cm2 and 63.5 kV/cm, respectively, in PMN-PT thin films. The leakage current densities of pure and 2.5% Pr-PMN-PT thin films were on the order of 1.24 × 10−4 A/cm2 and 5.8 × 10−5 A/cm2, respectively, at 100 kV/cm. A high pyroelectric coefficient (py) with a value of 167 μC/m2K was obtained in 2.5% Pr-PMN-PT thin films on Si substrate, which makes this material suitable for application in infrared detectors.
机译:[001]取向的Pr 3 + 掺杂的Pb(Mg1 / 3Nb2 / 3)O3-0.30PbTiO3(Pr-PMN-PT)薄膜的组成接近相变相界(MPB)。通过溶胶-凝胶法合成。使用X射线衍射表征晶体结构。发现在650℃下退火3分钟的Pr-PMN-PT薄膜中获得了单一钙钛矿相。在室温下,2.5%Pr-PMN-PT薄膜的介电常数(εr)值为2400,比纯PMN-PT样品高110%。通过2.5%Pr 3 + 掺杂,剩余极化(Pr)和矫顽场(Ec)值从11.5μC/ cm 2 和35 kV / cm增加到17.3μC/ PMN-PT薄膜中的cm 2 和63.5 kV / cm。纯和2.5%Pr-PMN-PT薄膜的泄漏电流密度分别为1.24×10 -4 A / cm 2 和5.8×10 −5 A / cm 2 分别在100 kV / cm时。在Si衬底上的2.5%Pr-PMN-PT薄膜中获得了167μC/ m 2 K的高热电系数(py),这使得该材料适用于红外探测器。

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