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Voltage clamp with double sucrose gap technique. External series resistance compensation.

机译:电压钳采用双蔗糖间隙技术。外部串联电阻补偿。

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摘要

In this paper we deal with the double sucrose-gap voltage clamp technique. To perform a reliable clamp or to analyze the intracellular potential distribution, any external series resistance in the artificial node must be taken into account for it induces an instability in the external potential as soon as a current develops. A circuit was designed to compensate for this error, it has been found effective on an analog model and on experimental uni- or multicellular preparations. The attenuation in series resistance frequently causes ringing in the step response. This behavior was studied theoretically and also simulated with analog models where a selective bridged-T network was found to represent the electrical characteristics of the preparation when associated with the chamber and control electronics. A residual series resistance was found and is considered to be a part of the preparation. Characteristics necessary to obtain best results are proposed, for a preparation to be studied in experiments utilizing the double sucrose gap technique with external series resistance compensation.
机译:在本文中,我们讨论了双蔗糖间隙电压钳技术。为了执行可靠的钳位或分析细胞内电势分布,必须考虑到人工结点中的任何外部串联电阻,因为一旦电流形成,它会引起外部电势的不稳定。设计了一种电路来补偿该误差,已经发现它对模拟模型和实验性单细胞或多细胞制剂均有效。串联电阻的衰减通常会导致阶跃响应中出现振铃。从理论上研究了这种行为,并且还通过模拟模型进行了模拟,在模拟模型中,与室和控制电子设备相关联时,发现了选择性的桥接T型网络代表制剂的电气特性。发现了残留的串联电阻,被认为是准备工作的一部分。提出了获得最佳结果所必需的特性,以便在使用带有外部串联电阻补偿的双蔗糖间隙技术的实验中研究该制剂。

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