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Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model

机译:通过直接逆非对称PI磁滞模型改善原子力显微镜成像

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摘要

A modified Prandtl–Ishlinskii (PI) model, referred to as a direct inverse asymmetric PI (DIAPI) model in this paper, was implemented to reduce the displacement error between a predicted model and the actual trajectory of a piezoelectric actuator which is commonly found in AFM systems. Due to the nonlinearity of the piezoelectric actuator, the standard symmetric PI model cannot precisely describe the asymmetric motion of the actuator. In order to improve the accuracy of AFM scans, two series of slope parameters were introduced in the PI model to describe both the voltage-increase-loop (trace) and voltage-decrease-loop (retrace). A feedforward controller based on the DIAPI model was implemented to compensate hysteresis. Performance of the DIAPI model and the feedforward controller were validated by scanning micro-lenses and standard silicon grating using a custom-built AFM.
机译:本文采用了改进的Prandtl–Ishlinskii(PI)模型,称为直接逆非对称PI(DIAPI)模型,以减少压电致动器的预测模型和实际轨迹之间的位移误差,该误差通常在压电致动器中发现。 AFM系统。由于压电致动器的非线性,标准对称PI模型无法精确描述致动器的非对称运动。为了提高AFM扫描的准确性,在PI模型中引入了两个系列的斜率参数,以描述电压增加环路(迹线)和电压减少环路(迹线)。实现了基于DIAPI模型的前馈控制器以补偿磁滞。通过使用定制的AFM扫描微透镜和标准硅光栅,可以验证DIAPI模型和前馈控制器的性能。

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