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Ratchet effect study in Si/SiGe heterostructures in the presence of asymmetrical antidots for different polarizations of microwaves

机译:在不对称解毒剂存在下针对微波不同极化的Si / SiGe异质结构中的棘轮效应研究

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摘要

In this work, we studied the photovoltage response of an antidot lattice to microwave radiation for different antidot parameters. The study was carried out in a Si/SiGe heterostructure by illuminating the antidot lattice with linearly polarized microwaves and recording the polarity of induced photovoltage for different angles of incidence. Our study revealed that with increased antidot density and etching depth, the polarity of induced photovoltage changed when the angle of incidence was rotated 90 degrees. In samples with large antidot density and/or a deeply etched antidot lattice, scattering was dominated by electron interaction with the asymmetrical potential created by semicircular antidots. The strong electron–electron interaction prevailed in other cases. Our study provides insight into the mechanism of interaction between microwaves and electrons in an antidot lattice, which is the key for developing an innovative ratchet-based device. Moreover, we present an original and fundamental example of antidot lattice etching through the use of a two-dimensional electron gas. This system deals with a hole lattice instead of an electron depletion in the antidot lattice region.
机译:在这项工作中,我们研究了针对不同的解毒剂参数的解毒剂晶格对微波辐射的光电压响应。该研究是在Si / SiGe异质结构中进行的,方法是用线偏振微波照射解毒剂晶格,并记录不同入射角下感应光电压的极性。我们的研究表明,随着点数密度和蚀刻深度的增加,入射角旋转90度时,感应光电压的极性会发生变化。在具有较大解毒剂密度和/或深度蚀刻的解毒剂晶格的样品中,散射主要是由电子相互作用以及半圆形解毒剂产生的不对称电位引起的。在其他情况下,电子与电子之间的相互作用很强。我们的研究提供了对解毒剂点阵中微波与电子相互作用机理的深入了解,这是开发创新的基于棘轮装置的关键。此外,我们提出了通过使用二维电子气进行点阵刻蚀的原始和基本示例。该系统处理空穴点阵,而不是解毒点阵区域中的电子耗尽。

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