首页> 美国卫生研究院文献>Plant Physiology >Rapid Uptake of Aluminum into Cells of Intact Soybean Root Tips (A Microanalytical Study Using Secondary Ion Mass Spectrometry).
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Rapid Uptake of Aluminum into Cells of Intact Soybean Root Tips (A Microanalytical Study Using Secondary Ion Mass Spectrometry).

机译:快速吸收完整的大豆根尖细胞中的铝(使用二次离子质谱的微分析研究)。

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摘要

A wide range of physiological disorders has been reported within the first few hours of exposing intact plant roots to moderate levels of Al3+. Past microanalytic studies, largely limited to electron probe x-ray microanalysis, have been unable to detect intracellular Al in this time frame. This has led to the suggestion that Al exerts its effect solely from extracellular or remote tissue sites. Here, freeze-dried cryosections (10 [mu]m thick) collected from the soybean (Glycine max) primary root tip (0.3-0.8 mm from the apex) were analyzed using secondary ion mass spectrometry (SIMS). The high sensitivity of SIMS for Al permitted the first direct evidence of early entry of Al into root cells. Al was found in cells of the root tip after a 30-min exposure of intact roots to 38 [mu]M Al3+. The accumulation of Al was greatest in the first 30 [mu]m, i.e. two to three cell layers, but elevated Al levels extended at least 150 [mu]m inward from the root edge. Intracellular Al concentrations at the root periphery were estimated to be about 70 nmol g-1 fresh weight. After 18 h of exposure, Al was evident throughout the root cross-section, although the rate of accumulation had slowed considerably from that during the initial 30 min. These results are consistent with the hypothesis that early effects of Al toxicity at the root apex, such as those on cell division, cell extension, or nutrient transport, involve the direct intervention of Al on cell function.
机译:在完整植物根系暴露于中等水平的Al3 +的最初几个小时内,已报道了多种生理疾病。过去的微分析研究主要限于电子探针X射线微分析,在此时间范围内无法检测到细胞内的铝。这就提示铝仅从细胞外或远端组织部位发挥作用。在此,使用二次离子质谱法(SIMS)分析了从大豆(Glycine max)初级根尖(距顶点0.3-0.8mm)收集的冻干冷冻切片(10μm厚)。 SIMS对Al的高敏感性使Al能够早期进入根细胞的第一个直接证据。在完整根暴露于38μMAl3 + 30分钟后,在根尖细胞中发现了Al。在最初的30μm,即2至3个细胞层中,Al的积累最大,但是升高的Al水平从根边缘向内延伸至少150μm。根周围的细胞内Al浓度估计为约70nmol g-1鲜重。暴露18小时后,尽管在最初的30分钟内积累速率已大大降低,但在整个根部横截面均可见到Al。这些结果与这样的假说相符,即铝毒在根尖的早期影响,例如对细胞分裂,细胞扩展或营养运输的影响,涉及铝对细胞功能的直接干预。

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