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Tuning the Doping Ratio and Phase Transition Temperature of VO2 Thin Film by Dual-Target Co-Sputtering

机译:通过双靶共溅射调节VO2薄膜的掺杂率和相变温度

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摘要

A new simple way for tuning the phase transition temperature (PTT) of VO2 thin films has been proposed to solve the problem of changing the doping ratio by using the dual-target co-sputtering method. A series of samples with W doping ratios of 0%, 0.5%, 1%, 1.5% and 2% have been fabricated by sputtering V films with the power of pure and 2% W-doped V targets from 500 W: 0 W, 500 W: 250 W, 500 W: 500 W, 250 W: 500 W to 0 W: 500 W respectively and then annealed in an oxygen atmosphere to form VO2. The XRD results of both pure and W-doped VO2 samples reveal that VO2 forms and is the main component after annealing. The PTT can be tuned by controlling the sputtering power ratio of the pure and doped targets. It can be tuned easily from 64.3 °C to 36.5 °C by using the pure and 2% W-doped targets for demonstration, with W doping ratios from 0% to 2%. It is also valid for other doping elements and is a promising approach for the large-scale production of sputtering.
机译:为了解决使用双靶共溅射法改变掺杂比的问题,提出了一种新的调节VO 2薄膜的相变温度(PTT)的简单方法。通过溅射V膜制备了一系列W掺杂率为0%,0.5%,1%,1.5%和2%的样品,其纯净功率和2%W掺杂的V靶的功率为500 W:0 W, 500 W:250 W,500 W:500 W,250 W:500 W至0 W:500 W,然后在氧气气氛中退火形成VO2。纯VO2和掺W VO2样品的XRD结果表明,VO2形成并且是退火后的主要成分。可以通过控制纯靶和掺杂靶的溅射功率比来调整PTT。通过使用纯的和2%的W掺杂靶进行演示,可以轻松地将其从64.3°C调节到36.5°C,W掺杂比从0%到2%。它对于其他掺杂元素也是有效的,并且是大规模生产溅射的有前途的方法。

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