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Investigation of structural and electronic properties of epitaxial graphene on 3C–SiC(100)/Si(100) substrates

机译:3C–SiC(100)/ Si(100)衬底上外延石墨烯的结构和电子性能研究

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摘要

Graphene has been intensively studied in recent years in order to take advantage of its unique properties. Its synthesis on SiC substrates by solid-state graphitization appears a suitable option for graphene-based electronics. However, before developing devices based on epitaxial graphene, it is desirable to understand and finely control the synthesis of material with the most promising properties. To achieve these prerequisites, many studies are being conducted on various SiC substrates. Here, we review 3C–SiC(100) epilayers grown by chemical vapor deposition on Si(100) substrates for producing graphene by solid state graphitization under ultrahigh-vacuum conditions. Based on various characterization techniques, the structural and electrical properties of epitaxial graphene layer grown on 3C–SiC(100)/Si(100) are discussed. We establish that epitaxial graphene presents properties similar to those obtained using hexagonal SiC substrates, with the advantage of being compatible with current Si-processing technology.
机译:为了利用石墨烯的独特性质,近年来对其进行了深入研究。通过固态石墨化在SiC衬底上合成它似乎是基于石墨烯的电子产品的合适选择。但是,在开发基于外延石墨烯的器件之前,需要了解并精细控制具有最有前途性能的材料的合成。为了达到这些先决条件,正在各种SiC衬底上进行许多研究。在这里,我们回顾了通过化学气相沉积在Si(100)衬底上生长的3C–SiC(100)外延层,以在超高真空条件下通过固态石墨化生产石墨烯。基于各种表征技术,讨论了在3C–SiC(100)/ Si(100)上生长的外延石墨烯层的结构和电学性质。我们确定外延石墨烯具有与使用六边形SiC衬底获得的相似的性能,并具有与当前Si处理技术兼容的优点。

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